Starnberg, 3. aug. 2016 - Ausführlicher Untersuchungsbericht zur realen Zuverlässigkeit von Datacenter SSD-Flashdrives im Google RZ-Produktivbetrieb...

Ein Dokument der Autoren Bianca Schroeder, University von Toronto und Raghav Lagisetty / Arif Merchant von Google Inc., veröffentlich im Rahmen der 14. usenix.org Benutzerkonferenz - FAST '16 - in Santa Clara (CA).

Quellenangabe: This paper is included in the Proceedings of the 14th USENIX Conference on File and Storage Technologies FAST ’16. February 22–25, 2016 • Santa Clara, CA, USA ISBN 978-1-931971-28-7

Weblink > https://www.usenix.org/conference/fast16/technical-sessions/presentation/schroeder

Auszug aus der Einleitung des Dokument (Orginaltext): "As solid state drives based on flash technology are becoming a staple for persistent data storage in data centers, it is important to understand their reliability characteris- tics. While there is a large body of work based on ex- periments with individual flash chips in a controlled lab environment under synthetic workloads, there is a dearth of information on their behavior in the field. This paper provides a large-scale field study covering many millions of drive days, ten different drive models, different flash technologies (MLC, eMLC, SLC) over 6 years of production use in Google’s data centers. We study a wide range of reliability characteristics and come to a number of unexpected conclusions..." (Zitatende).

Den vollständigen Report finden Sie auch hier als PDF-Dokument im Anhang zu dieser Webseite (2,57 MB)